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NASA NTRS · Conference Paper

Single-event upset in advanced commercial power PC microprocessors

Published 2018-06-07 From Jet Propulsion Laboratory 4 authors
View on NASA NTRS ↗

Attribution

This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Jet Propulsion Laboratory.

Abstract

Verbatim from NASA NTRS. Not paraphrased, not summarized.

Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.

Authors

  • Irom, F.
  • Farmanesh, F.
  • Swift, G. M.
  • Johnston, A. H.

Keywords

  • single-event upset advanced commercial power PC processors

Citation: Irom, F., Farmanesh, F., Swift, G. M. , et al. (2018). Single-event upset in advanced commercial power PC microprocessors. Jet Propulsion Laboratory. NASA NTRS ID 20060028712. https://ntrs.nasa.gov/citations/20060028712 ↗