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Single-event upset in advanced commercial power PC microprocessors

NASA NTRS · Conference Paper · 20060028712 · Published 2018-06-07 · Jet Propulsion Laboratory · 4 authors

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Jet Propulsion Laboratory.

Abstract

Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.

Authors

  • Irom, F.
  • Farmanesh, F.
  • Swift, G. M.
  • Johnston, A. H.

Keywords

  • single-event upset advanced commercial power PC processors

Citation

Irom, F., Farmanesh, F., Swift, G. M. , et al. (2018). Single-event upset in advanced commercial power PC microprocessors. Jet Propulsion Laboratory. NASA NTRS ID 20060028712. https://ntrs.nasa.gov/citations/20060028712 ↗