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Single-event upset in advanced PowerPC microprocessors

NASA NTRS · Conference Paper · 20060029795 · Published 2018-06-07 · Jet Propulsion Laboratory · 4 authors

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Jet Propulsion Laboratory.

Abstract

Proton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances.

Authors

  • Irom, F.
  • Swift, G. M.
  • Farmanesh, F.
  • Millward, D. G.

Keywords

  • radiation single-event upset

Citation

Irom, F., Swift, G. M., Farmanesh, F. , et al. (2018). Single-event upset in advanced PowerPC microprocessors. Jet Propulsion Laboratory. NASA NTRS ID 20060029795. https://ntrs.nasa.gov/citations/20060029795 ↗