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NASA NTRS · Conference Paper

Single-event upset in advanced PowerPC microprocessors

Published 2018-06-07 From Jet Propulsion Laboratory 4 authors
View on NASA NTRS ↗

Attribution

This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Jet Propulsion Laboratory.

Abstract

Verbatim from NASA NTRS. Not paraphrased, not summarized.

Proton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances.

Authors

  • Irom, F.
  • Swift, G. M.
  • Farmanesh, F.
  • Millward, D. G.

Keywords

  • radiation single-event upset

Citation: Irom, F., Swift, G. M., Farmanesh, F. , et al. (2018). Single-event upset in advanced PowerPC microprocessors. Jet Propulsion Laboratory. NASA NTRS ID 20060029795. https://ntrs.nasa.gov/citations/20060029795 ↗