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NASA NTRS · Conference Paper
Modeling Increased Complexity and the Reliance on Automation: FLightdeck Automation Problems (FLAP) Model
Attribution
This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Langley Research Center.
Abstract
Verbatim from NASA NTRS. Not paraphrased, not summarized.
This paper highlights the development of a model that is focused on the safety issue of increasing complexity and reliance on automation systems in transport category aircraft. Recent statistics show an increase in mishaps related to manual handling and automation errors due to pilot complacency and over-reliance on automation, loss of situational awareness, automation system failures and/or pilot deficiencies. Consequently, the aircraft can enter a state outside the flight envelope and/or air traffic safety margins which potentially can lead to loss-of-control (LOC), controlled-flight-into-terrain (CFIT), or runway excursion/confusion accidents, etc. The goal of this modeling effort is to provide NASA's Aviation Safety Program (AvSP) with a platform capable of assessing the impacts of AvSP technologies and products towards reducing the relative risk of automation related accidents and incidents. In order to do so, a generic framework, capable of mapping both latent and active causal factors leading to automation errors, is developed. Next, the framework is converted into a Bayesian Belief Network model and populated with data gathered from Subject Matter Experts (SMEs). With the insertion of technologies and products, the model provides individual and collective risk reduction acquired by technologies and methodologies developed within AvSP.
Authors
- Ancel, Ersin National Inst. of Aerospace
- Shih, Ann T. NASA Langley Research Center
Citation: Ancel, Ersin, Shih, Ann T. (2019). Modeling Increased Complexity and the Reliance on Automation: FLightdeck Automation Problems (FLAP) Model. Langley Research Center. NASA NTRS ID 20150004530. https://ntrs.nasa.gov/citations/20150004530 ↗