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NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage

NASA NTRS · Presentation · 20240006599 · Published 2024-06-03 · Goddard Space Flight Center · 1 author

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Goddard Space Flight Center.

Author

  • Eric Galloway Science Systems and Applications (United States)

Keywords

  • EEE
  • failure analysis
  • integrated circuit (IC)
  • isolation
  • electrical damage

Citation

Eric Galloway (2024). NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage. Goddard Space Flight Center. NASA NTRS ID 20240006599. https://ntrs.nasa.gov/citations/20240006599 ↗