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NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage

Published 2024-06-03 From Goddard Space Flight Center 1 author
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Attribution

This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Goddard Space Flight Center.

Author

  • Eric Galloway Science Systems and Applications (United States)

Keywords

  • EEE
  • failure analysis
  • integrated circuit (IC)
  • isolation
  • electrical damage

Citation: Eric Galloway (2024). NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage. Goddard Space Flight Center. NASA NTRS ID 20240006599. https://ntrs.nasa.gov/citations/20240006599 ↗