Research papers
5,883 papers · NASA NTRS, NTSB, FAA CAMI
NASA NTRS · 1,269 NTSB Safety Studies · 12 NTSB Aircraft Accident Reports · 17 Embry-Riddle Scholarly Commons · 1,993
6 matches · NASA NTRSElectronics And Electrical Engineering
- NASA NTRS 2019 GRC Presentation
Nature-Inspired Motivation for Developing Self-Healable Electrical Insulation
Polymeric aircraft electrical insulation normally degrade by partial discharge with increasing voltage, which causes excessive localized Joule heating in the material and ultimately leads to dielectric failure of the ins…
- NASA NTRS 2019 LaRC Conference Paper
Ultrasonic Inspection to Quantify Failure Pathologies of Crimped Electrical Connections
Previous work has shown that ultrasonic inspection provides a means of assessing electrical crimp quality that ensures the electrical and mechanical integrity of an initial crimp before the installation process is comple…
- NASA NTRS 2019 JPL Preprint (Draft being sent to journal)
Elimination of Potential Electrical Stress During EMC (CS01) Testing
This viewgraph presentation reviews possible ways to eliminate electrical stress during Electromagneticic Compatibility (EMC) testing. The presentation reviews tests that have had problems due to electrical stress.
- NASA NTRS 2019 GRC Conference Paper
Frequency Spectrum for Integration of Unmanned Aircraft
The goal of enabling the integration of unmanned aircraft systems (UAS) into the National Airspace System (NAS) in terms of UAS achieving routine access to the NAS has been established as a national goal in the United St…
- NASA NTRS 2019 JPL Preprint (Draft being sent to journal)
Frequency Dependence of Single-Event Upset in Highly Advanced PowerPC Microprocessors
Single-event upset effects from heavy ions were measured for Motorola silicon-on-insulator (SOI) microprocessor with 90 nm feature sizes at three frequencies of 500, 1066 and 1600 MHz.
- NASA NTRS 2019 JPL Conference Paper
Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors
This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency.