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Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors

NASA NTRS · Conference Paper · 20070023697 · Published 2019-07-12 · Jet Propulsion Laboratory · 4 authors

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Jet Propulsion Laboratory.

Abstract

This paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SOI processors with feature sizes of 0.18 microns and two different core voltages. Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.

Authors

  • Irom, Frokh Jet Propulsion Lab., California Inst. of Tech.
  • Farmanesh, Farhad F. Jet Propulsion Lab., California Inst. of Tech.
  • Swift, Gary M. Jet Propulsion Lab., California Inst. of Tech.
  • Johnston, Allen H. Jet Propulsion Lab., California Inst. of Tech.

Keywords

  • single-event upset (SEU)
  • microprocessors
  • radiation testing

Citation

Irom, Frokh, Farmanesh, Farhad F., Swift, Gary M. , et al. (2019). Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC Microprocessors. Jet Propulsion Laboratory. NASA NTRS ID 20070023697. https://ntrs.nasa.gov/citations/20070023697 ↗