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NASA NTRS · Technical Memorandum (TM)

Failure Analysis of Electrical Pin Connectors

Published 2019-07-10 From Langley Research Center 4 authors
Read paper (PDF) ↗ View on NASA NTRS ↗

Attribution

This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Langley Research Center.

Abstract

Verbatim from NASA NTRS. Not paraphrased, not summarized.

A study was initiated to determine the root cause of failure for circuit board electrical connection pins that failed during vibRatory testing. The circuit board is part of an unmanned space probe, and the vibratory testing was performed to ensure component survival of launch loading conditions. The results of this study show that the pins failed as a result of fatigue loading.

Authors

  • Newman, John A. NASA Langley Research Center
  • Baughman, James M. Lockheed Martin Mission Services Co.
  • Smith, Stephen W. NASA Langley Research Center
  • Herath, Jeffrey A. NASA Langley Research Center

Citation: Newman, John A., Baughman, James M., Smith, Stephen W. , et al. (2019). Failure Analysis of Electrical Pin Connectors. Langley Research Center. NASA NTRS ID 20080043565. https://ntrs.nasa.gov/citations/20080043565 ↗