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Failure Analysis of Electrical Pin Connectors

NASA NTRS · Technical Memorandum (TM) · 20080043565 · Published 2019-07-10 · Langley Research Center · 4 authors

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Langley Research Center.

Abstract

A study was initiated to determine the root cause of failure for circuit board electrical connection pins that failed during vibRatory testing. The circuit board is part of an unmanned space probe, and the vibratory testing was performed to ensure component survival of launch loading conditions. The results of this study show that the pins failed as a result of fatigue loading.

Authors

  • Newman, John A. NASA Langley Research Center
  • Baughman, James M. Lockheed Martin Mission Services Co.
  • Smith, Stephen W. NASA Langley Research Center
  • Herath, Jeffrey A. NASA Langley Research Center

Citation

Newman, John A., Baughman, James M., Smith, Stephen W. , et al. (2019). Failure Analysis of Electrical Pin Connectors. Langley Research Center. NASA NTRS ID 20080043565. https://ntrs.nasa.gov/citations/20080043565 ↗