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NASA NTRS · Conference Paper

Predicting and Measuring System Error Rates for Designs Incorporating Upset Mitigation based on Triple Modular Redundancy

Published 2019-07-12 From Jet Propulsion Laboratory 2 authors
View on NASA NTRS ↗

Attribution

This is the abstract and citation. Full text lives at NASA NTRS — we link out rather than host. All credit to the authors and Jet Propulsion Laboratory.

Abstract

Verbatim from NASA NTRS. Not paraphrased, not summarized.

This viewgraph presentation reviews the basics of single event upset mitigation, triple-module redundancy (TMR), new "fitting" equation for TMR, and examples of application to real data.

Authors

  • Swift, Gary M. Jet Propulsion Lab., California Inst. of Tech.
  • Edmonds, Larry D. Jet Propulsion Lab., California Inst. of Tech.

Keywords

  • triple redundant
  • single event upset (SEU)
  • triple modular redundancy (TMR)
  • upset mitigation

Citation: Swift, Gary M., Edmonds, Larry D. (2019). Predicting and Measuring System Error Rates for Designs Incorporating Upset Mitigation based on Triple Modular Redundancy. Jet Propulsion Laboratory. NASA NTRS ID 20090007946. https://ntrs.nasa.gov/citations/20090007946 ↗