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Predicting and Measuring System Error Rates for Designs Incorporating Upset Mitigation based on Triple Modular Redundancy

NASA NTRS · Conference Paper · 20090007946 · Published 2019-07-12 · Jet Propulsion Laboratory · 2 authors

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Abstract and citation only, verbatim from NASA NTRS; full text lives there. All credit to the authors and Jet Propulsion Laboratory.

Abstract

This viewgraph presentation reviews the basics of single event upset mitigation, triple-module redundancy (TMR), new "fitting" equation for TMR, and examples of application to real data.

Authors

  • Swift, Gary M. Jet Propulsion Lab., California Inst. of Tech.
  • Edmonds, Larry D. Jet Propulsion Lab., California Inst. of Tech.

Keywords

  • triple redundant
  • single event upset (SEU)
  • triple modular redundancy (TMR)
  • upset mitigation

Citation

Swift, Gary M., Edmonds, Larry D. (2019). Predicting and Measuring System Error Rates for Designs Incorporating Upset Mitigation based on Triple Modular Redundancy. Jet Propulsion Laboratory. NASA NTRS ID 20090007946. https://ntrs.nasa.gov/citations/20090007946 ↗